Literals
- fabio:hasPublicationYear
- 2007
- dcterms:contributor
- Jin Su Jeong, S.-H. Hong,S.-D. Park
- bibo:doi
- 10.1016/j.microrel.2007.07.087
- vivo:identifier
- 2007-709
- bibo:issn
- 0026-2714
- bibo:page_range
- 1795 - 1799
- dcterms:publisher
- Microelectronics reliability
- ou:tipoPublicacion
- Article
- dcterms:title
- Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
- ou:urlDialnet
- bibo:volume
- 47
Inverse Relations
- Has related: ou:tienePublicacion