Literals
- vivo:identifier
- 2008-748
- bibo:doi
- 10.1016/j.microrel.2008.07.029
- dcterms:contributor
- Jin Su Jeong, J.-K. Jung,S.-D. Park
- fabio:hasPublicationYear
- 2008
- bibo:issn
- 0026-2714
- bibo:page_range
- 1216 - 1220
- dcterms:publisher
- Microelectronics reliability
- ou:tipoPublicacion
- Article
- dcterms:title
- Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.
- ou:urlDialnet
- bibo:volume
- 48
Inverse Relations
- Has related: ou:tienePublicacion