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<http://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/revistas/Revista/2012-8537> a bibo:Journal;
    ou:sjrMejorCuartil "Q1";
    ou:codigoRevista "1557-9662";
    vcard:country-name "United States";
    ou:categoriaSJR "Electrical and Electronic Engineering (Q1)";
    dcterms:publisher "Institute of Electrical and Electronics Engineers Inc.";
    ou:codigoRevista "0018-9456";
    bibo:eissn "1557-9662";
    ou:sjr "0.715"^^xsd:Decimal;
    ou:categoriaSJR "Instrumentation (Q1)";
    dcterms:coverage "1963-2020";
    vcard:region "Northern America";
    dcterms:identifier "2012-8537";
    dcterms:title "IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT";
    bibo:issn "0018-9456".
<http://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/2012-261> ou:publicadaEnRevista <http://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/revistas/Revista/2012-8537>.