Reliability of the ab initio potentials for simple van der Waals systems based on second virial and thermal diffusion coefficients | Open Data UNEx

https://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/1994-86

Literals

ou:eid
- 2-s2.0-43949149107
dcterms:creator
- Tolosa S.
dcterms:contributor
ou:vecesCitado
- 1
dcterms:publisher
- Journal of Molecular Structure: THEOCHEM
vivo:identifier
- 1994-86
fabio:hasPublicationYear
- 1994
bibo:doi
- 10.1016/0166-1280(94)80142-8
bibo:issn
- 0166-1280
bibo:page_range
- 69-78
ou:tipoPublicacion
- Article
dcterms:title
- Reliability of the ab initio potentials for simple van der Waals systems based on second virial and thermal diffusion coefficients
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=43949149107&origin=inward
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=43949149107&origin=inward
bibo:volume
- 305

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