Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system

Literals

• dcterms:title
  • Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system
• dcterms:contributor
  • Curras-Francos M.C.
• dcterms:creator
  • Curras-Francos M.C.
• ou:eid
  • 2-s2.0-0032217901
• fabio:hasPublicationYear
  • 1998
• vivo:identifier
  • 1998-326
• bibo:page_range
  • 427-431
• dcterms:publisher
  • Conference Proceedings of the International Symposium on Signals, Systems and Electronics
• ou:tipoPublicacion
  • Article
• vcard:url
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0032217901&origin=inward
• ou:urlScopus
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0032217901&origin=inward
• ou:vecesCitado
  • 4

Typed Literals

• dcterms:created
  • 1998-12-01T00:00:00 (xsd:dateTime)

Inverse Relations

• Has related: ou:tienePublicacion
  • YOLANDA CAMPOS ROCA