Fundamental parameters approach in the Rietveld method: A study of the stability of results versus the accuracy of the instrumental profile

Literals

dcterms:creator
- Ortiz A.L.
dcterms:title
- Fundamental parameters approach in the Rietveld method: A study of the stability of results versus the accuracy of the instrumental profile
bibo:doi
- 10.1016/s0955-2219(00)00056-x
vivo:identifier
- 2000-232
dcterms:contributor
- Ortiz, A.L.; Cumbrera, F.L.; Sánchez-Bajo, F.; Guiberteau, F.; Caruso, R.
bibo:page_range
- 1845-1851
bibo:issn
- 0955-2219
ou:eid
- 2-s2.0-0034301804
ou:bibtex
- @article{Sánchez2000,title = {Fundamental parameters approach in the Rietveld method: A study of the stability of results versus the accuracy of the instrumental profile},journal = {Journal of the European Ceramic Society},year = {2000},volume = {20},number = {11},pages = {1845-1851},author = {Ortiz, A.L. and Cumbrera, F.L. and S{\'a}nchez-Bajo, F. and Guiberteau, F. and Caruso, R.}}
dcterms:publisher
- Journal of the European Ceramic Society
fabio:hasPublicationYear
- 2000
ou:tipoPublicacion
- Article
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0034301804&origin=inward
ou:urlOrcid
- http://www.scopus.com/inward/record.url?eid=2-s2.0-0034301804&partnerID=MN8TOARS
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=0034301804&origin=inward
bibo:volume
- 20