Degradation of Instrumentation Amplifiers Due to the Nonionizing Energy Loss Damage

Literals

ou:urlOrcid
- http://www.scopus.com/inward/record.url?eid=2-s2.0-1242310168&partnerID=MN8TOARS
bibo:doi
- 10.1109/tns.2003.820628
dcterms:contributor
- Franco, F.J.; Lozano, J.; Santos, J.P.; Agapito, J.A.
ou:bibtex
- @article{Lozano2003,title = {Degradation of Instrumentation Amplifiers Due to the Nonionizing Energy Loss Damage},journal = {IEEE Transactions on Nuclear Science},year = {2003},volume = {50},number = {6 II},pages = {2433-2440},author = {Franco, F.J. and Lozano, J. and Santos, J.P. and Agapito, J.A.}}
dcterms:creator
- Franco F.J.
dcterms:publisher
- IEEE Transactions on Nuclear Science
vivo:identifier
- 2003-207
fabio:hasPublicationYear
- 2003
ou:eid
- 2-s2.0-1242310168
bibo:issn
- 0018-9499
bibo:page_range
- 2433-2440
ou:tipoPublicacion
- Conference Paper
dcterms:title
- Degradation of Instrumentation Amplifiers Due to the Nonionizing Energy Loss Damage
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=1242310168&origin=inward
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=1242310168&origin=inward
ou:vecesCitado
- 5
bibo:volume
- 50