Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.

Literals

• bibo:volume
  • 47
• ou:tipoPublicacion
  • Article
• fabio:hasPublicationYear
  • 2007
• bibo:issn
  • 0026-2714
• ou:editorial
  • Elsevier Science
• bibo:doi
  • 10.1016/j.microrel.2007.07.087
• dcterms:contributor
  • Jeong, Jin Su
• bibo:page_range
  • 1795 - 1799
• vivo:identifier
  • 2007-709
• dcterms:publisher
  • Microelectronics reliability
• dcterms:title
  • Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
• ou:urlDialnet
  • https://dialnet.unirioja.es/servlet/articulo?codigo=2380128

Typed Literals

• dcterms:created
  • 2007-11-04T00:00:00 (xsd:dateTime)
• dcterms:modified
  • 2022-02-25T00:00:00 (xsd:dateTime)

Inverse Relations

• Has related: ou:tienePublicacion
  • JIN SU JEONG