Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.

Literals

• bibo:volume
  • 48
• vivo:identifier
  • 2008-748
• dcterms:contributor
  • Jeong, Jin Su
• fabio:hasPublicationYear
  • 2008
• bibo:doi
  • 10.1016/j.microrel.2008.07.029
• ou:editorial
  • Elsevier Science
• bibo:issn
  • 0026-2714
• bibo:page_range
  • 1216 - 1220
• dcterms:publisher
  • Microelectronics reliability
• ou:tipoPublicacion
  • Article
• dcterms:title
  • Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.
• ou:urlDialnet
  • https://dialnet.unirioja.es/servlet/articulo?codigo=2717839

Typed Literals

• dcterms:created
  • 2008-10-13T00:00:00 (xsd:dateTime)
• dcterms:modified
  • 2022-02-25T00:00:00 (xsd:dateTime)

Inverse Relations

• Has related: ou:tienePublicacion
  • JIN SU JEONG