Impact of Metallization Layer Structure on the Performance of G-Band Branch-Line Couplers

Literals

bibo:doi
- 10.1109/lmwc.2015.2496778
bibo:issn
- 1531-1309
ou:eid
- 2-s2.0-84961789631
vivo:identifier
- 2015-847
fabio:hasPublicationYear
- 2015
dcterms:creator
- Amado-Rey B.
ou:bibtex
- @article{RID:0629170601764-17, title = {Impact of Metallization Layer Structure on the Performance of G-Band Branch-Line Couplers}, journal = {Ieee Microwave and Wireless Components Letters}, year = {2015}, author = {Amado-Rey, B. and Campos-Roca, Y. and Weber, R. and Maroldt, S. and Tessmann, A. and Massler, H. and Wagner, S. and Leuther, A. and Ambacher, O.}, volume = {25}, number = {12}, pages = {793-795} }
dcterms:contributor
- Amado-Rey, B.; Campos-Roca, Y.; Weber, R.; Maroldt, S.; Tessmann, A.; Massler, H.; Wagner, S.; Leuther, A.; Ambacher, O.
bibo:page_range
- 793-795
dcterms:publisher
- IEEE Microwave and Wireless Components Letters
ou:tipoPublicacion
- Article
dcterms:title
- Impact of Metallization Layer Structure on the Performance of G-Band Branch-Line Couplers
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84961789631&origin=inward
ou:urlOrcid
- http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000366967800010&KeyUID=WOS:000366967800010
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84961789631&origin=inward
ou:vecesCitado
- 4
bibo:volume
- 25