Analysis of Skin Effect in Single Wire Resistance by Finite Element Methods

Literals

• ou:urlScopus
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85090826585&origin=inward
• dcterms:contributor
  • Gonzalez-Teodoro J.R.; Kindl V.; Romero-Cadaval E.; Asensi R.
• dcterms:title
  • Analysis of Skin Effect in Single Wire Resistance by Finite Element Methods
• ou:eid
  • 2-s2.0-85090826585
• bibo:doi
  • 10.1109/cpe-powereng48600.2020.9161540
• dcterms:creator
  • Gonzalez-Teodoro J.R.
• fabio:hasPublicationYear
  • 2020
• vivo:identifier
  • 2020-1326
• bibo:isbn
  • 9781728142180
• bibo:page_range
  • 19-23
• dcterms:publisher
  • Proceedings - 2020 IEEE 14th International Conference on Compatibility, Power Electronics and Power Engineering, CPE-POWERENG 2020
• ou:tipoPublicacion
  • Conference Paper
• vcard:url
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85090826585&origin=inward

Typed Literals

• dcterms:created
  • 2020-07-01T00:00:00 (xsd:dateTime)
• ou:vecesCitado
  • 11 (xsd:integer)

Inverse Relations

• Has related: ou:tienePublicacion
  • ENRIQUE ROMERO CADAVAL