Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor

Literals

vivo:identifier
- 2022-501
dcterms:contributor
- Corbacho I.; Carrillo J.M.; Ausin J.L.; Dominguez M.A.; Perez-Aloe R.; Duque-Carrillo J.F.
ou:bibtex
- @inproceedings{Corbacho_2022, doi = {10.1109/smacd55068.2022.9816190}, url = {https://doi.org/10.1109%2Fsmacd55068.2022.9816190}, year = 2022, month = {jun}, publisher = {{IEEE}}, author = {Israel Corbacho and Juan M. Carrillo and Jose L. Ausin and Miguel A. Dominguez and Raquel Perez-Aloe and J. Francisco Duque-Carrillo}, title = {Impact of Process Variations on the Performance of a Widely Tunable {CMOS} Transconductor}, booktitle = {2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design ({SMACD})}}
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85134731749&origin=inward
fabio:hasPublicationYear
- 2022
dcterms:creator
- Corbacho I.
bibo:doi
- 10.1109/smacd55068.2022.9816190
ou:eid
- 2-s2.0-85134731749
bibo:isbn
- 9781665467032
dcterms:publisher
- Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022
ou:tipoPublicacion
- Conference Paper
dcterms:title
- Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85134731749&origin=inward
ou:urlOrcid
- http://dx.doi.org/10.1109/smacd55068.2022.9816190
ou:vecesCitado
- 2