Optoresistive Measurement System for the Characterization of Metal Oxide Based Nanosensors

Literals

• ou:urlScopus
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85218502921&origin=inward
• ou:eid
  • 2-s2.0-85218502921
• dcterms:contributor
  • Santos J.P.; Sanchez-Vicente C.; Sayago I.; Lozano J.
• dcterms:creator
  • Santos J.P.
• bibo:doi
  • 10.1007/978-3-031-82076-2_12
• ou:tipoPublicacion
  • Conference Paper
• bibo:issn
  • 1876-1100
• bibo:eissn
  • 1876-1119
• vivo:identifier
  • 2025-801
• bibo:isbn
  • 9783031820755
• fabio:hasPublicationYear
  • 2025
• bibo:page_range
  • 81-87
• dcterms:publisher
  • Lecture Notes in Electrical Engineering
• dcterms:title
  • Optoresistive Measurement System for the Characterization of Metal Oxide Based Nanosensors
• vcard:url
  • https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85218502921&origin=inward
• ou:vecesCitado
  • 0
• bibo:volume
  • 1334

Typed Literals

• dcterms:created
  • 2025-01-01T00:00:00 (xsd:dateTime)

Inverse Relations

• Has related: ou:tienePublicacion
  • JESÚS SALVADOR LOZANO ROGADO