Literals
- ou:categoriaSJR
- Electrical and Electronic Engineering (Q1)
- Electronic, Optical and Magnetic Materials (Q2)
- Nanoscience and Nanotechnology (Q3)
- Surfaces, Coatings and Films (Q2)
- Condensed Matter Physics (Q2)
- Safety, Risk, Reliability and Quality (Q1)
- Atomic and Molecular Physics, and Optics (Q2)
- vcard:country-name
- United Kingdom
- ou:codigoRevista
- 0026-2714
- dcterms:coverage
- 1962-2020
- bibo:eissn
- 1872-941X
- dcterms:identifier
- 2009-3089
- bibo:issn
- 0026-2714
- dcterms:publisher
- Elsevier Ltd.
- vcard:region
- Western Europe
- ou:sjrMejorCuartil
- Q1
- dcterms:title
- MICROELECTRONICS RELIABILITY
Typed Literals
- ou:sjr
- 0.686 (http://www.w3.org/2001/XMLSchema#Decimal)