IEEE MTT-S International Microwave Symposium Digest

Literals

• ou:categoriaSJR
  • Condensed Matter Physics
  • Radiation
  • Electrical and Electronic Engineering
• ou:codigoRevista
  • 0149-645X
• vcard:country-name
  • United States
• dcterms:coverage
  • 1976, 1980-1981, 1983-1985, 1987-2014, 2016-2019
• dcterms:identifier
  • 2010-11691
• dcterms:publisher
  • Institute of Electrical and Electronics Engineers Inc.
• vcard:region
  • Northern America
• dcterms:title
  • IEEE MTT-S International Microwave Symposium Digest

Typed Literals

• ou:sjr
  • 0.495 (http://www.w3.org/2001/XMLSchema#Decimal)

Inverse Relations

• Has related: ou:publicadaEnRevista
  • Use of ground planes within the spatial images technique: Application to the analysis of rectangular multilayered shielded enclosures