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<https://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/1998-258> bibo:doi "10.1109/issse.1998.738110";
    dcterms:contributor "Curras-Francos, MC; Tasker, PJ; Fernandez-Barciela, M; OKeefe, SS; Sanchez, E; Campos-Roca, Y; Edwards, GD; Phillips, WA; IEEE";
    dcterms:publisher "1998 Ursi Symposium on Signals, Systems, and Electr Onics";
    dcterms:title "Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system";
    ou:bibtex "@article{RID:0629170601768-13, title = {Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system}, journal = {1998 Ursi Symposium on Signals, Systems, and Electr Onics}, year = {1998}, author = {Curras-Francos, MC and Tasker, PJ and Fernandez-Barciela, M and O'Keefe, SS and Sanchez, E and Campos-Roca, Y and Edwards, GD and Phillips, WA and IEEE}, pages = {427-431} }";
    vivo:identifier "1998-258";
    vcard:url <http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000078335500084&KeyUID=WOS:000078335500084>;
    fabio:hasPublicationYear "1998";
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<https://opendata.unex.es/recurso/educacion/universidad/personal/bd09d1eb202e6563151c189e42c7c3a4-yolanda-campos-roca> ou:tienePublicacion <https://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/1998-258>.