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    bibo:doi "10.1557/jmr.2004.0454";
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    dcterms:title "Effect of oxide and nitride films on strength of silicon: A study using controlled small-scale flaws";
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<https://opendata.unex.es/recurso/educacion/universidad/personal/94fb89a800431b28a0839ed05c7576d1-antonia-pajares-vicente> ou:tienePublicacion <https://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/2004-311>.