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    dcterms:publisher "Journal of Applied Crystallography";
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    bibo:doi "10.1107/s0021889806017122";
    ou:bibtex "@article{Sánchez2006,title = {Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks},journal = {Journal of Applied Crystallography},year = {2006},volume = {39},number = {4},pages = {598-600},author = {S{\\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}";
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