@prefix config: . @prefix meta: . @prefix rdf: . @prefix rdfs: . @prefix xsd: . @prefix owl: . @prefix dc: . @prefix dcmitype: . @prefix dcterms: . @prefix foaf: . @prefix geo: . @prefix om: . @prefix locn: . @prefix schema: . @prefix skos: . @prefix dbpedia: . @prefix p: . @prefix yago: . @prefix units: . @prefix geonames: . @prefix prv: . @prefix prvTypes: . @prefix doap: . @prefix void: . @prefix ir: . @prefix ou: . @prefix teach: . @prefix time: . @prefix datex: . @prefix aiiso: . @prefix vivo: . @prefix bibo: . @prefix fabio: . @prefix vcard: . @prefix swrcfe: . @prefix frapo: . @prefix org: . @prefix ei2a: . @prefix pto: . bibo:doi "10.1007/s00339-008-4732-7"; ou:bibtex "@article{Sánchez2009,title = {An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks},journal = {Applied Physics A: Materials Science and Processing},year = {2009},volume = {94},number = {1},pages = {189-194},author = {S{\\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}"; dcterms:title "An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks"; bibo:eissn "1432-0630"; dcterms:creator "Sánchez-Bajo F."; vcard:url ; ou:urlOrcid ; bibo:volume "94"; bibo:issn "0947-8396"; ou:eid "2-s2.0-56349162949"; ou:vecesCitado "7"^^xsd:integer; dcterms:created "2009-01-01T00:00:00"^^xsd:dateTime; dcterms:contributor "Sánchez-Bajo, F.; Ortiz, A.L.; Cumbrera, F.L."; bibo:page_range "189-194"; dcterms:publisher "Applied Physics A: Materials Science and Processing"; ou:tipoPublicacion "Article"; a ou:Publicacion; vivo:identifier "2009-631"; ou:urlScopus ; fabio:hasPublicationYear "2009"; ou:publicadaEnRevista , . ou:tienePublicacion . ou:tienePublicacion .