@prefix config: . @prefix meta: . @prefix rdf: . @prefix rdfs: . @prefix xsd: . @prefix owl: . @prefix dc: . @prefix dcmitype: . @prefix dcterms: . @prefix foaf: . @prefix geo: . @prefix om: . @prefix locn: . @prefix schema: . @prefix skos: . @prefix dbpedia: . @prefix p: . @prefix yago: . @prefix units: . @prefix geonames: . @prefix prv: . @prefix prvTypes: . @prefix doap: . @prefix void: . @prefix ir: . @prefix ou: . @prefix teach: . @prefix time: . @prefix datex: . @prefix aiiso: . @prefix vivo: . @prefix bibo: . @prefix fabio: . @prefix vcard: . @prefix swrcfe: . @prefix frapo: . @prefix org: . @prefix ei2a: . @prefix pto: . vcard:url ; bibo:volume "24"; bibo:doi "10.1088/0953-8984/24/21/215301"; dcterms:contributor "Pantoja-Cortes J.; Sanchez-Bajo F.; Ortiz A.L."; ou:bibtex "@article{Sánchez2012,title = {A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks},journal = {Journal of Physics Condensed Matter},year = {2012},volume = {24},number = {21},author = {Pantoja-Cort{\\'e}s, J. and S{\\'a}nchez-Bajo, F. and Ortiz, A.L.}}"; ou:eid "2-s2.0-84860630817"; dcterms:creator "Pantoja-Cortés J."; dcterms:title "A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks"; bibo:issn "0953-8984"; dcterms:publisher "Journal of Physics Condensed Matter"; ou:urlScopus ; dcterms:created "2012-05-30T00:00:00"^^xsd:dateTime; fabio:hasPublicationYear "2012"; ou:vecesCitado "7"^^xsd:integer; ou:urlOrcid ; ou:tipoPublicacion "Article"; a ou:Publicacion; bibo:eissn "1361-648X"; vivo:identifier "2012-821"; ou:publicadaEnRevista , . ou:tienePublicacion . ou:tienePublicacion .