@prefix config: . @prefix meta: . @prefix rdf: . @prefix rdfs: . @prefix xsd: . @prefix owl: . @prefix dc: . @prefix dcmitype: . @prefix dcterms: . @prefix foaf: . @prefix geo: . @prefix om: . @prefix locn: . @prefix schema: . @prefix skos: . @prefix dbpedia: . @prefix p: . @prefix yago: . @prefix units: . @prefix geonames: . @prefix prv: . @prefix prvTypes: . @prefix doap: . @prefix void: . @prefix ir: . @prefix ou: . @prefix teach: . @prefix time: . @prefix datex: . @prefix aiiso: . @prefix vivo: . @prefix bibo: . @prefix fabio: . @prefix vcard: . @prefix swrcfe: . @prefix frapo: . @prefix org: . @prefix ei2a: . @prefix pto: . ou:codigoRevista "1051-4651"; dcterms:coverage "1982, 1984, 1986, 1988, 1990, 1992, 1994, 1996, 1998, 2000, 2002, 2004, 2006, 2008, 2010, 2012, 2014, 2016, 2018"; dcterms:title "Proceedings - International Conference on Pattern Recognition"; a bibo:Journal; ou:sjr "0.314"^^xsd:Decimal; vcard:region "Northern America"; ou:categoriaSJR "Computer Vision and Pattern Recognition"; vcard:country-name "United States"; dcterms:identifier "2012-14088"; dcterms:publisher "Institute of Electrical and Electronics Engineers Inc.". ou:publicadaEnRevista .