https://opendata.unex.es/recurso/ciencia-tecnologia/investigacion/publicaciones/Publicacion/1998-258
Literals
- ou:bibtex
- @article{RID:0629170601768-13, title = {Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system}, journal = {1998 Ursi Symposium on Signals, Systems, and Electr Onics}, year = {1998}, author = {Curras-Francos, MC and Tasker, PJ and Fernandez-Barciela, M and O'Keefe, SS and Sanchez, E and Campos-Roca, Y and Edwards, GD and Phillips, WA and IEEE}, pages = {427-431} }
- dcterms:contributor
- Curras-Francos, MC; Tasker, PJ; Fernandez-Barciela, M; OKeefe, SS; Sanchez, E; Campos-Roca, Y; Edwards, GD; Phillips, WA; IEEE
- bibo:doi
- 10.1109/issse.1998.738110
- fabio:hasPublicationYear
- vivo:identifier
- dcterms:publisher
- 1998 Ursi Symposium on Signals, Systems, and Electr Onics
- ou:tipoPublicacion
- dcterms:title
- Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system
- vcard:url
- ou:urlOrcid
