Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks

Literals

dcterms:publisher
- Journal of Applied Crystallography
bibo:page_range
- 598-600
ou:eid
- 2-s2.0-33746443955
bibo:issn
- 0021-8898
dcterms:creator
- Sánchez-Bajo F.
ou:bibtex
- @article{Sánchez2006,title = {Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks},journal = {Journal of Applied Crystallography},year = {2006},volume = {39},number = {4},pages = {598-600},author = {S{\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}
bibo:doi
- 10.1107/s0021889806017122
bibo:eissn
- 1600-5767
fabio:hasPublicationYear
- 2006
vivo:identifier
- 2006-484
dcterms:contributor
- Sánchez-Bajo, F.; Ortiz, A.L.; Cumbrera, F.L.
ou:tipoPublicacion
- Article
dcterms:title
- Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33746443955&origin=inward
ou:urlOrcid
- http://www.scopus.com/inward/record.url?eid=2-s2.0-33746443955&partnerID=MN8TOARS
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33746443955&origin=inward
ou:vecesCitado
- 37
bibo:volume
- 39