A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks

Literals

bibo:issn
- 0953-8984
vivo:identifier
- 2012-821
bibo:doi
- 10.1088/0953-8984/24/21/215301
dcterms:contributor
- Pantoja-Cortes J.; Sanchez-Bajo F.; Ortiz A.L.
ou:bibtex
- @article{Sánchez2012,title = {A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks},journal = {Journal of Physics Condensed Matter},year = {2012},volume = {24},number = {21},author = {Pantoja-Cort{\'e}s, J. and S{\'a}nchez-Bajo, F. and Ortiz, A.L.}}
ou:eid
- 2-s2.0-84860630817
dcterms:creator
- Pantoja-Cortés J.
bibo:eissn
- 1361-648X
fabio:hasPublicationYear
- 2012
dcterms:publisher
- Journal of Physics Condensed Matter
ou:tipoPublicacion
- Article
dcterms:title
- A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks
vcard:url
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860630817&origin=inward
ou:urlOrcid
- http://www.scopus.com/inward/record.url?eid=2-s2.0-84860630817&partnerID=MN8TOARS
ou:urlScopus
- https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84860630817&origin=inward
bibo:volume
- 24