PUBLICACIÓN

Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system

ACCEDER A LA PUBLICACIÓN: Orcid

Curras-Francos, MC, Tasker, PJ, Fernandez-Barciela, M, "OKeefe, SS", Sanchez, E, Campos-Roca, Y, Edwards, GD, Phillips, WA, IEEE

1998

DOI

10.1109/issse.1998.738110

BIBTEX

@article{RID:0629170601768-13, title = {Accurate HEMT model extraction and validation in class A and B bias points using a full two-port large signal on-wafer measurement system}, journal = {1998 Ursi Symposium on Signals, Systems, and Electr Onics}, year = {1998}, author = {Curras-Francos, MC and Tasker, PJ and Fernandez-Barciela, M and O'Keefe, SS and Sanchez, E and Campos-Roca, Y and Edwards, GD and Phillips, WA and IEEE}, pages = {427-431} }

AUTORES DE LA UEX

Yolanda Campos Roca

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