PUBLICACIÓN
Logistic regression for simulating damage occurrence on a fruit grading line
Bielza, C., Barreiro, P., Rodríguez-Galiano, M.I., Martín, J.
2003 Computers and Electronics in Agriculture
CITAS
20
DOI
10.1016/s0168-1699(03)00021-8
EID
2-s2.0-0038034497
ISSN
0168-1699
BIBTEX
@article{Martín2003,title = {Logistic regression for simulating damage occurrence on a fruit grading line},journal = {Computers and Electronics in Agriculture},year = {2003},volume = {39},number = {2},pages = {95-113},author = {Bielza, C. and Barreiro, P. and Rodr{\'i}guez-Galiano, M.I. and Mart{\'i}n, J.}}
AUTORES DE LA UEX