PUBLICACIÓN

Logistic regression for simulating damage occurrence on a fruit grading line

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Bielza, C., Barreiro, P., Rodríguez-Galiano, M.I., Martín, J.

2003 Computers and Electronics in Agriculture


CITAS

20

DOI

10.1016/s0168-1699(03)00021-8

EID

2-s2.0-0038034497

ISSN

0168-1699

BIBTEX

@article{Martín2003,title = {Logistic regression for simulating damage occurrence on a fruit grading line},journal = {Computers and Electronics in Agriculture},year = {2003},volume = {39},number = {2},pages = {95-113},author = {Bielza, C. and Barreiro, P. and Rodr{\'i}guez-Galiano, M.I. and Mart{\'i}n, J.}}


AUTORES DE LA UEX