PUBLICACIÓN

Nanoscale aggregation phenomena at the contact line of air-drying pure water droplets on silicon revealed by atomic force microscopy

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Méndez-Vilas, A., Jódar-Reyes, A.B., Díaz, J., González-Martín, M.L.

2009 CURRENT APPLIED PHYSICS

Materials Science (miscellaneous) (Q2), Physics and Astronomy (miscellaneous) (Q2)

JCR: 1.586

SJR: 0.644


CITAS

5

DOI

10.1016/j.cap.2007.11.009

EID

2-s2.0-51249102381

ISSN

1567-1739

BIBTEX

@article { gonzlezmartn2009,title = {Nanoscale aggregation phenomena at the contact line of air-drying pure water droplets on silicon revealed by atomic force microscopy},journal = {Current Applied Physics},year = {2009},volume = {9},number = {1},pages = {48-58},author = {Méndez-Vilas, A. and Jódar-Reyes, A.B. and Díaz, J. and González-Martín, M.L.}}


AUTORES DE LA UEX