PUBLICACIÓN
Technological variability by means of a framework metamodel
Alonso J.G., Olmeda J.B., Murillo J.M.
2014 Proceedings - 2014 IIAI 3rd International Conference on Advanced Applied Informatics, IIAI-AAI 2014
CITAS
0
DOI
10.1109/iiai-aai.2014.137
EID
2-s2.0-84918579341
BIBTEX
@article{Murillo2014,title = {Technological variability by means of a framework metamodel},journal = {Proceedings - 2014 IIAI 3rd International Conference on Advanced Applied Informatics, IIAI-AAI 2014},year = {2014},pages = {656-661},author = {Alonso, J.G. and Olmeda, J.B. and Murillo, J.M.}}
AUTORES DE LA UEX