PUBLICACIÓN
Tear-and-Interconnect Domain Decomposition Scheme for Solving Multiscale Composite Penetrable Objects
Martin V.F., Larios D., Solis D.M., Taboada J.M., Landesa L., Obelleiro F.
2020 IEEE Access
Computer Science (miscellaneous) (Q1), Engineering (miscellaneous) (Q1), Materials Science (miscellaneous) (Q2)
JCR: 3.367
SJR: 0.587
CITAS
8
DOI
10.1109/access.2020.3000650
EID
2-s2.0-85086991707
EISSN
2169-3536
BIBTEX
@article{Martin_2020, doi = {10.1109/access.2020.3000650}, url = {https://doi.org/10.1109%2Faccess.2020.3000650}, year = 2020, publisher = {Institute of Electrical and Electronics Engineers ({IEEE})}, volume = {8}, pages = {107345--107352}, author = {Victor F. Martin and David Larios and Diego M. Solis and Jose M. Taboada and Luis Landesa and Fernando Obelleiro}, title = {Tear-and-Interconnect Domain Decomposition Scheme for Solving Multiscale Composite Penetrable Objects}, journal = {{IEEE} Access}}
AUTORES DE LA UEX