PUBLICACIÓN

Robust Normalized Softmax Loss for Deep Metric Learning-Based Characterization of Remote Sensing Images with Label Noise

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Kang J., Fernandez-Beltran R., Duan P., Kang X., Plaza A.J.

2021 IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING

Earth and Planetary Sciences (miscellaneous) (Q1), Electrical and Electronic Engineering (Q1)

JCR: 8.125

SJR: 2.404


CITAS

35

DOI

10.1109/tgrs.2020.3042607

EID

2-s2.0-85098782035

ISSN

0196-2892

EISSN

1558-0644

BIBTEX

@article{Kang_2021, doi = {10.1109/tgrs.2020.3042607}, url = {https://doi.org/10.1109%2Ftgrs.2020.3042607}, year = 2021, month = {oct}, publisher = {Institute of Electrical and Electronics Engineers ({IEEE})}, volume = {59}, number = {10}, pages = {8798--8811}, author = {Jian Kang and Ruben Fernandez-Beltran and Puhong Duan and Xudong Kang and Antonio J. Plaza}, title = {Robust Normalized Softmax Loss for Deep Metric Learning-Based Characterization of Remote Sensing Images With Label Noise}, journal = {{IEEE} Transactions on Geoscience and Remote Sensing} }


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