PUBLICACIÓN
Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor
Corbacho I., Carrillo J.M., Ausin J.L., Dominguez M.A., Perez-Aloe R., Duque-Carrillo J.F.
2022 Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022
CITAS
2
DOI
10.1109/smacd55068.2022.9816190
EID
2-s2.0-85134731749
ISBN
9781665467032
BIBTEX
@inproceedings{Corbacho_2022,doi = {10.1109/smacd55068.2022.9816190},url = {https://doi.org/10.1109%2Fsmacd55068.2022.9816190},year = 2022,month = {jun},publisher = {{IEEE}},author = {Israel Corbacho and Juan M. Carrillo and Jose L. Ausin and Miguel A. Dominguez and Raquel Perez-Aloe and J. Francisco Duque-Carrillo},title = {Impact of Process Variations on the Performance of a Widely Tunable {CMOS} Transconductor},booktitle = {2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design ({SMACD})}}
AUTORES DE LA UEX