PUBLICACIÓN

Impact of Process Variations on the Performance of a Widely Tunable CMOS Transconductor

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Corbacho I., Carrillo J.M., Ausin J.L., Dominguez M.A., Perez-Aloe R., Duque-Carrillo J.F.

2022 Proceedings - 2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2022


CITAS

2

DOI

10.1109/smacd55068.2022.9816190

EID

2-s2.0-85134731749

ISBN

9781665467032

BIBTEX

@inproceedings{Corbacho_2022, doi = {10.1109/smacd55068.2022.9816190}, url = {https://doi.org/10.1109%2Fsmacd55068.2022.9816190}, year = 2022, month = {jun}, publisher = {{IEEE}}, author = {Israel Corbacho and Juan M. Carrillo and Jose L. Ausin and Miguel A. Dominguez and Raquel Perez-Aloe and J. Francisco Duque-Carrillo}, title = {Impact of Process Variations on the Performance of a Widely Tunable {CMOS} Transconductor}, booktitle = {2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design ({SMACD})}}


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