PUBLICACIÓN
An electron injection model for time-dependent simulators of nanoscale devices with electron confinement: Application to the comparison of the intrinsic noise of 3D-, 2D- and 1D-ballistic transistors
2007 Solid-State Electronics
CITAS
23
DOI
10.1016/j.sse.2007.01.011
EID
2-s2.0-33847260243
ISSN
0038-1101
AUTORES DE LA UEX