PUBLICACIÓN

Rigorous investigation of RF breakdown effects in high power microstrip passive circuits

ACCEDER A LA PUBLICACIÓN: Scopus

2009 IEEE MTT-S International Microwave Symposium Digest

Condensed Matter Physics, Electrical and Electronic Engineering, Radiation

SJR: 0.533


CITAS

12

DOI

10.1109/mwsym.2009.5165826

EID

2-s2.0-77949992512

ISSN

0149-645X

ISBN

9781424428045


AUTORES DE LA UEX