PUBLICACIÓN
Rigorous investigation of RF breakdown effects in high power microstrip passive circuits
2009 IEEE MTT-S International Microwave Symposium Digest
Condensed Matter Physics, Electrical and Electronic Engineering, Radiation
SJR: 0.533
CITAS
12
DOI
10.1109/mwsym.2009.5165826
EID
2-s2.0-77949992512
ISSN
0149-645X
ISBN
9781424428045
AUTORES DE LA UEX