PUBLICACIÓN
Strength of silicon containing nanoscale flaws
Pajares, A, Chumakov, M, Lawn, BR
2004 Journal of Materials Research
CITAS
14
DOI
10.1557/jmr.2004.19.2.657
EID
2-s2.0-1842665127
ISSN
0884-2914
BIBTEX
@article{RID:0719151526174-25, title = {Strength of silicon containing nanoscale flaws}, journal = {Journal of Materials Research}, year = {2004}, author = {Pajares, A and Chumakov, M and Lawn, BR}, volume = {19}, number = {2}, pages = {657-660} }
AUTORES DE LA UEX