PUBLICACIÓN

The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Sánchez-Bajo, F., Cumbrera, F.L.

1997 Journal of Applied Crystallography

CITAS

140

DOI

10.1107/s0021889896015464

EID

2-s2.0-0040747394

ISSN

0021-8898

BIBTEX

@article{Sánchez1997,title = {The Use of the Pseudo-Voigt Function in the Variance Method of X-ray Line-Broadening Analysis},journal = {Journal of Applied Crystallography},year = {1997},volume = {30},number = {4},pages = {427-430},author = {S{\'a}nchez-Bajo, F. and Cumbrera, F.L.}}

AUTORES DE LA UEX

Florentino Sánchez Bajo

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