PUBLICACIÓN
Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry
Sánchez-Bajo, F., Ortiz, A.L., Cumbrera, F.L.
2006 Acta Materialia
CITAS
50
DOI
10.1016/j.actamat.2005.08.018
EID
2-s2.0-27744574653
ISSN
1359-6454
BIBTEX
@article{Sánchez2006,title = {Novel analytical model for the determination of grain size distributions in nanocrystalline materials with low lattice microstrains by X-ray diffractometry},journal = {Acta Materialia},year = {2006},volume = {54},number = {1},pages = {1-10},author = {S{\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}
AUTORES DE LA UEX