PUBLICACIÓN
Accuracy of X-ray diffraction SiC polytype-composition analyses performed by a polymorphic method
Cumbrera, F.L., Ortiz, A.L., Sánchez-Bajo, F.
2001 Journal of Materials Science Letters
CITAS
1
DOI
10.1023/a:1006715727875
EID
2-s2.0-0035864556
ISSN
0261-8028
BIBTEX
@article { ortiz2001,title = {Accuracy of X-ray diffraction SiC polytype-composition analyses performed by a polymorphic method},journal = {Journal of Materials Science Letters},year = {2001},volume = {20},number = {4},pages = {297-299},author = {Sánchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}
AUTORES DE LA UEX