PUBLICACIÓN

Ion nitriding of zirconia coated on stainless steel: Structure and mechanical properties

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Caruso, R., Gómez, B.J., De Sanctis, O., Feugeas, J., Díaz-Parralejo, A., Sánchez-Bajo, F.

2004 Thin Solid Films

CITAS

14

DOI

10.1016/j.tsf.2004.06.125

EID

2-s2.0-4644303420

ISSN

0040-6090

BIBTEX

@article{Díaz-Parralejo2004,title = {Ion nitriding of zirconia coated on stainless steel: Structure and mechanical properties},journal = {Thin Solid Films},year = {2004},volume = {468},number = {1-2},pages = {142-148},author = {Caruso, R. and G{\'o}mez, B.J. and De Sanctis, O. and Feugeas, J. and D{\'i}az-Parralejo, A. and S{\'a}nchez-Bajo, F.}}

AUTORES DE LA UEX

Antonio Díaz Parralejo
Florentino Sánchez Bajo

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Determination Of Lattice Parameters Of Polytypes In Liquid-Phase-Sintered Sic Using The Rietveld Method
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A Measure Of The Solar Rotation During The Maunder Minimum
Robustness In The Suppression Of Bidirectional Chaotic Escape From A Potential Well By Weak Parametric Excitations
A Measure Of The Solar Rotation During The Maunder Minimum
Robustness In The Suppression Of Bidirectional Chaotic Escape From A Potential Well By Weak Parametric Excitations
Quantitative Polytype-Composition Analyses Of Sic Using X-Ray Diffraction: A Critical Comparison Between The Polymorphic And The Rietveld Methods
Robustness In The Suppression Of Bidirectional Chaotic Escape From A Potential Well By Weak Parametric Excitations
Quantitative Polytype-Composition Analyses Of Sic Using X-Ray Diffraction: A Critical Comparison Between The Polymorphic And The Rietveld Methods
X-Ray Powder Diffraction Analysis Of A Silicon Carbide-Based Ceramic
Quantitative Polytype-Composition Analyses Of Sic Using X-Ray Diffraction: A Critical Comparison Between The Polymorphic And The Rietveld Methods
X-Ray Powder Diffraction Analysis Of A Silicon Carbide-Based Ceramic
On The Transformation Toughening Of Y-Zro2 Ceramics With Mixed Y-Tzp/psz Microstructures
X-Ray Powder Diffraction Analysis Of A Silicon Carbide-Based Ceramic
On The Transformation Toughening Of Y-Zro2 Ceramics With Mixed Y-Tzp/psz Microstructures
Accuracy Of X-Ray Diffraction Sic Polytype-Composition Analyses Performed By A Polymorphic Method
On The Transformation Toughening Of Y-Zro2 Ceramics With Mixed Y-Tzp/psz Microstructures
Accuracy Of X-Ray Diffraction Sic Polytype-Composition Analyses Performed By A Polymorphic Method
Deconvolution Of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study Of Polycrystalline 9-Ysz
Accuracy Of X-Ray Diffraction Sic Polytype-Composition Analyses Performed By A Polymorphic Method
Deconvolution Of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study Of Polycrystalline 9-Ysz
X-Ray Powder Diffraction Analysis Of Liquid-Phase-Sintered Silicon Carbide Ceramics
Deconvolution Of X-Ray Diffraction Profiles Using Series Expansion: A Line-Broadening Study Of Polycrystalline 9-Ysz
X-Ray Powder Diffraction Analysis Of Liquid-Phase-Sintered Silicon Carbide Ceramics
Controlled Preparation And Characterization Of Multilayer Sol-Gel Zirconia Dip-Coatings
X-Ray Powder Diffraction Analysis Of Liquid-Phase-Sintered Silicon Carbide Ceramics
Controlled Preparation And Characterization Of Multilayer Sol-Gel Zirconia Dip-Coatings
Multilayer Coatings Preparation Of Zirconia-Based By Sol-Gel Route; Microstructural And Mechanical Characterisation
Controlled Preparation And Characterization Of Multilayer Sol-Gel Zirconia Dip-Coatings
Multilayer Coatings Preparation Of Zirconia-Based By Sol-Gel Route; Microstructural And Mechanical Characterisation
Mechanical Properties Of Cork Under Contact Stresses
Multilayer Coatings Preparation Of Zirconia-Based By Sol-Gel Route; Microstructural And Mechanical Characterisation
Mechanical Properties Of Cork Under Contact Stresses
Atmospheric Extinction Of Stellar Radiation In The Optical Domain
Mechanical Properties Of Cork Under Contact Stresses
Atmospheric Extinction Of Stellar Radiation In The Optical Domain
Fundamental Parameters Approach In The Rietveld Method: A Study Of The Stability Of Results Versus The Accuracy Of The Instrumental Profile
Atmospheric Extinction Of Stellar Radiation In The Optical Domain
Fundamental Parameters Approach In The Rietveld Method: A Study Of The Stability Of Results Versus The Accuracy Of The Instrumental Profile
Quantitative Phase-Composition Analysis Of Liquid-Phase-Sintered Silicon Carbide Using The Rietveld Method
Fundamental Parameters Approach In The Rietveld Method: A Study Of The Stability Of Results Versus The Accuracy Of The Instrumental Profile
Quantitative Phase-Composition Analysis Of Liquid-Phase-Sintered Silicon Carbide Using The Rietveld Method
Deconvolution Of X-Ray Diffraction Profiles By Using Series Expansion
Quantitative Phase-Composition Analysis Of Liquid-Phase-Sintered Silicon Carbide Using The Rietveld Method
Deconvolution Of X-Ray Diffraction Profiles By Using Series Expansion
Criterios Básicos Sobre Diseño Y Cálculo De Materiales Compuestos
Deconvolution Of X-Ray Diffraction Profiles By Using Series Expansion
Criterios Básicos Sobre Diseño Y Cálculo De Materiales Compuestos
A Gaussian-Hermite Polynomials Function For X-Ray Diffraction Profile Fitting
Criterios Básicos Sobre Diseño Y Cálculo De Materiales Compuestos
A Gaussian-Hermite Polynomials Function For X-Ray Diffraction Profile Fitting
Respuesta Eléctrica De Nanocristales Zro2-3mol% Y2o3
A Gaussian-Hermite Polynomials Function For X-Ray Diffraction Profile Fitting
Respuesta Eléctrica De Nanocristales Zro2-3mol% Y2o3
A Strange Attractor On A Daily Timescale In The Visual Observations Of Z And?
Respuesta Eléctrica De Nanocristales Zro2-3mol% Y2o3
A Strange Attractor On A Daily Timescale In The Visual Observations Of Z And?
Reclado De Materiales
A Strange Attractor On A Daily Timescale In The Visual Observations Of Z And?
Reclado De Materiales
X-Ray Microstructural Characterization Of Y-Psz (5 Mol%) Nanocrystalline Powder Samples
Reclado De Materiales
X-Ray Microstructural Characterization Of Y-Psz (5 Mol%) Nanocrystalline Powder Samples
Phase Assemblage Effects On The Fracture And Fatigue Characteristics Of Magnesia-Partially Stabilized Zirconia
X-Ray Microstructural Characterization Of Y-Psz (5 Mol%) Nanocrystalline Powder Samples
Phase Assemblage Effects On The Fracture And Fatigue Characteristics Of Magnesia-Partially Stabilized Zirconia
Microstructure Effects In The X-Ray Powder Diffraction Profile Of 9 Mol% Mg-Psz
Phase Assemblage Effects On The Fracture And Fatigue Characteristics Of Magnesia-Partially Stabilized Zirconia
Microstructure Effects In The X-Ray Powder Diffraction Profile Of 9 Mol% Mg-Psz
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis
Microstructure Effects In The X-Ray Powder Diffraction Profile Of 9 Mol% Mg-Psz
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis. Erratum
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis. Erratum
Nonlinear And Chaotic Oscillations Of An India-Rubber Band
The Use Of The Pseudo-Voigt Function In The Variance Method Of X-Ray Line-Broadening Analysis. Erratum
Nonlinear And Chaotic Oscillations Of An India-Rubber Band
Differentiation Between Pseudocubic And Cubic Phases In Y-Zro2 Using Rietveld Analysis
Nonlinear And Chaotic Oscillations Of An India-Rubber Band
Differentiation Between Pseudocubic And Cubic Phases In Y-Zro2 Using Rietveld Analysis
The Use Of The Jmayk Kinetic Equation For The Analysis Of Solid-State Reactions: Critical Considerations And Recent Interpretations
Differentiation Between Pseudocubic And Cubic Phases In Y-Zro2 Using Rietveld Analysis
The Use Of The Jmayk Kinetic Equation For The Analysis Of Solid-State Reactions: Critical Considerations And Recent Interpretations
Espectroscopía De Impedancia De Monocristales 4.7 Mol% Y-Psz
The Use Of The Jmayk Kinetic Equation For The Analysis Of Solid-State Reactions: Critical Considerations And Recent Interpretations
Espectroscopía De Impedancia De Monocristales 4.7 Mol% Y-Psz
Caracterización Microestructural Del Sistema Y-Psz
Espectroscopía De Impedancia De Monocristales 4.7 Mol% Y-Psz
Caracterización Microestructural Del Sistema Y-Psz
Measurement Of Fiber Orientation In Short-Fiber Composites
Caracterización Microestructural Del Sistema Y-Psz
Measurement Of Fiber Orientation In Short-Fiber Composites
The Williams-Watts Dependence As A Common Phenomenological Approach To Relaxation Processes In Condensed Matter
Measurement Of Fiber Orientation In Short-Fiber Composites
The Williams-Watts Dependence As A Common Phenomenological Approach To Relaxation Processes In Condensed Matter
Microstructural Characterization Of Y-Psz (4 Mol%) Polycrystals By Means Of X-Ray Diffraction Experiments
The Williams-Watts Dependence As A Common Phenomenological Approach To Relaxation Processes In Condensed Matter
Microstructural Characterization Of Y-Psz (4 Mol%) Polycrystals By Means Of X-Ray Diffraction Experiments
La Programación De Máquinas-Herramienta Por Control Numérico
Microstructural Characterization Of Y-Psz (4 Mol%) Polycrystals By Means Of X-Ray Diffraction Experiments
La Programación De Máquinas-Herramienta Por Control Numérico
Manufacture And Characterization Of Polymer Concrete Combining Inorganic And Organic Fillers
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