PUBLICACIÓN
An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks
Sánchez-Bajo, F., Ortiz, A.L., Cumbrera, F.L.
2009 Applied Physics A: Materials Science and Processing
Chemistry (miscellaneous) (Q1), Materials Science (miscellaneous) (Q1)
JCR: 1.595
SJR: 1.013
CITAS
6
DOI
10.1007/s00339-008-4732-7
EID
2-s2.0-56349162949
ISSN
0947-8396
EISSN
1432-0630
BIBTEX
@article{Sánchez2009,title = {An analytical model for the determination of crystallite size and crystal lattice microstrain distributions in nanocrystalline materials from the variance of the X-ray diffraction peaks},journal = {Applied Physics A: Materials Science and Processing},year = {2009},volume = {94},number = {1},pages = {189-194},author = {S{\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}
AUTORES DE LA UEX