PUBLICACIÓN

Microstructural study of SnO2-based nanoparticles by X-ray diffractometry

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Chenari H.M., Sanchez-Bajo F.

2016 MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

Condensed Matter Physics (Q2), Materials Science (miscellaneous) (Q2), Mechanical Engineering (Q2), Mechanics of Materials (Q2)

JCR: 2.359

SJR: 0.637

CITAS

4

DOI

10.1016/j.mssp.2016.03.005

EID

2-s2.0-84962218980

ISSN

1369-8001

BIBTEX

@article{Sánchez2016,title = {Microstructural study of SnO<inf>2</inf>-based nanoparticles by X-ray diffractometry},journal = {Materials Science in Semiconductor Processing},year = {2016},volume = {49},pages = {15-19},author = {Chenari, H.M. and S{\'a}nchez-Bajo, F.}}

AUTORES DE LA UEX

Florentino Sánchez Bajo

OTRAS PUBLICACIONES DE INTERÉS

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