PUBLICACIÓN
Fundamental parameters approach in the Rietveld method: A study of the stability of results versus the accuracy of the instrumental profile
Ortiz, A.L., Cumbrera, F.L., Sánchez-Bajo, F., Guiberteau, F., Caruso, R.
2000 Journal of the European Ceramic Society
CITAS
29
DOI
10.1016/s0955-2219(00)00056-x
EID
2-s2.0-0034301804
ISSN
0955-2219
BIBTEX
@article{Sánchez2000,title = {Fundamental parameters approach in the Rietveld method: A study of the stability of results versus the accuracy of the instrumental profile},journal = {Journal of the European Ceramic Society},year = {2000},volume = {20},number = {11},pages = {1845-1851},author = {Ortiz, A.L. and Cumbrera, F.L. and S{\'a}nchez-Bajo, F. and Guiberteau, F. and Caruso, R.}}
AUTORES DE LA UEX