PUBLICACIÓN
A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks
Pantoja-Cortes J., Sanchez-Bajo F., Ortiz A.L.
2012 Journal of Physics Condensed Matter
Condensed Matter Physics (Q1), Materials Science (miscellaneous) (Q1)
JCR: 2.355
SJR: 1.688
CITAS
6
DOI
10.1088/0953-8984/24/21/215301
EID
2-s2.0-84860630817
ISSN
0953-8984
EISSN
1361-648X
BIBTEX
@article{Sánchez2012,title = {A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks},journal = {Journal of Physics Condensed Matter},year = {2012},volume = {24},number = {21},author = {Pantoja-Cort{\'e}s, J. and S{\'a}nchez-Bajo, F. and Ortiz, A.L.}}
AUTORES DE LA UEX