PUBLICACIÓN

A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Pantoja-Cortes J., Sanchez-Bajo F., Ortiz A.L.

2012 Journal of Physics Condensed Matter

Condensed Matter Physics (Q1), Materials Science (miscellaneous) (Q1)

JCR: 2.355

SJR: 1.688


CITAS

6

DOI

10.1088/0953-8984/24/21/215301

EID

2-s2.0-84860630817

ISSN

0953-8984

EISSN

1361-648X

BIBTEX

@article{Sánchez2012,title = {A line-broadening analysis model for the microstructural characterization of nanocrystalline materials from asymmetric x-ray diffraction peaks},journal = {Journal of Physics Condensed Matter},year = {2012},volume = {24},number = {21},author = {Pantoja-Cort{\'e}s, J. and S{\'a}nchez-Bajo, F. and Ortiz, A.L.}}


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