PUBLICACIÓN
Quantitative polytype-composition analyses of SiC using x-ray diffraction: A critical comparison between the polymorphic and the Rietveld methods
Ortiz, A.L., Sánchez-Bajo, F., Padture, N.P., Cumbrera, F.L., Guiberteau, F.
2001 Journal of the European Ceramic Society
CITAS
29
DOI
10.1016/s0955-2219(00)00332-0
EID
2-s2.0-0035452827
ISSN
0955-2219
BIBTEX
@article{Sánchez2001,title = {Quantitative polytype-composition analyses of SiC using x-ray diffraction: A critical comparison between the polymorphic and the Rietveld methods},journal = {Journal of the European Ceramic Society},year = {2001},volume = {21},number = {9},pages = {1237-1248},author = {Ortiz, A.L. and S{\'a}nchez-Bajo, F. and Padture, N.P. and Cumbrera, F.L. and Guiberteau, F.}}
AUTORES DE LA UEX