PUBLICACIÓN
Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks
Sánchez-Bajo, F., Ortiz, A.L., Cumbrera, F.L.
2006 Journal of Applied Crystallography
CITAS
37
DOI
10.1107/s0021889806017122
EID
2-s2.0-33746443955
ISSN
0021-8898
EISSN
1600-5767
BIBTEX
@article{Sánchez2006,title = {Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks},journal = {Journal of Applied Crystallography},year = {2006},volume = {39},number = {4},pages = {598-600},author = {S{\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}
AUTORES DE LA UEX