PUBLICACIÓN

Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Sánchez-Bajo, F., Ortiz, A.L., Cumbrera, F.L.

2006 Journal of Applied Crystallography


CITAS

37

DOI

10.1107/s0021889806017122

EID

2-s2.0-33746443955

ISSN

0021-8898

EISSN

1600-5767

BIBTEX

@article{Sánchez2006,title = {Analytical formulation of the variance method of line-broadening analysis for Voigtian X-ray diffraction peaks},journal = {Journal of Applied Crystallography},year = {2006},volume = {39},number = {4},pages = {598-600},author = {S{\'a}nchez-Bajo, F. and Ortiz, A.L. and Cumbrera, F.L.}}


AUTORES DE LA UEX