PUBLICACIÓN
Second-order advantage maintenance with voltammetric data modeling for quantitation of ethiofencarb in the presence of interferences
Diez, N.M.; Cabanillas, A.G.; Silva Rodríguez, A.; Goicoechea, H.C.
2015 TALANTA
Chemistry (miscellaneous) (Q1)
JCR: 4.035
SJR: 1.173
CITAS
10
DOI
10.1016/j.talanta.2014.10.006
EID
2-s2.0-84910049608
ISSN
0039-9140
BIBTEX
@article{Mora-Díez2015,title = {Second-order advantage maintenance with voltammetric data modeling for quantitation of ethiofencarb in the presence of interferences},journal = {Talanta},year = {2015},volume = {132},pages = {851-856},author = {Diez, N.M. and Cabanillas, A.G. and Silva Rodr{\'i}guez, A. and Goicoechea, H.C.}}
AUTORES DE LA UEX
