PUBLICACIÓN
Second-order advantage maintenance with voltammetric data modeling for quantitation of ethiofencarb in the presence of interferences
Diez N.M., Cabanillas A.G., Silva Rodriguez A., Goicoechea H.C.
2015 TALANTA
Chemistry (miscellaneous) (Q1)
JCR: 4.035
SJR: 1.173
CITAS
10
DOI
10.1016/j.talanta.2014.10.006
EID
2-s2.0-84910049608
ISSN
0039-9140
AUTORES DE LA UEX