PUBLICACIÓN

Second-order advantage maintenance with voltammetric data modeling for quantitation of ethiofencarb in the presence of interferences

ACCEDER A LA PUBLICACIÓN: Scopus Orcid

Diez N.M., Cabanillas A.G., Silva Rodriguez A., Goicoechea H.C.

2015 TALANTA

Chemistry (miscellaneous) (Q1)

JCR: 4.035

SJR: 1.173


CITAS

10

DOI

10.1016/j.talanta.2014.10.006

EID

2-s2.0-84910049608

ISSN

0039-9140

BIBTEX

@article{Mora-Díez2015,title = {Second-order advantage maintenance with voltammetric data modeling for quantitation of ethiofencarb in the presence of interferences},journal = {Talanta},year = {2015},volume = {132},pages = {851-856},author = {Diez, N.M. and Cabanillas, A.G. and Silva Rodr{\'i}guez, A. and Goicoechea, H.C.}}


AUTORES DE LA UEX