PUBLICACIÓN
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
Jeong, Jin Su
2007 Microelectronics reliability
DOI
10.1016/j.microrel.2007.07.087
ISSN
0026-2714
AUTORES DE LA UEX
PUBLICACIÓN
Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.
Jeong, Jin Su
2007 Microelectronics reliability
DOI
10.1016/j.microrel.2007.07.087
ISSN
0026-2714
AUTORES DE LA UEX
