PUBLICACIÓN

Field failure mechanism and improvement of EOS failure of integrated IGBT inverter modules.

ACCEDER A LA PUBLICACIÓN: Dialnet

Jin Su Jeong, S.-H. Hong, S.-D. Park

2007 Microelectronics reliability


DOI

10.1016/j.microrel.2007.07.087

ISSN

0026-2714


AUTORES DE LA UEX