PUBLICACIÓN

Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.

ACCEDER A LA PUBLICACIÓN: Dialnet

Jin Su Jeong, J.-K. Jung, S.-D. Park

2008 Microelectronics reliability


DOI

10.1016/j.microrel.2008.07.029

ISSN

0026-2714


AUTORES DE LA UEX