PUBLICACIÓN
Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED.
Jin Su Jeong, J.-K. Jung, S.-D. Park
2008 Microelectronics reliability
DOI
10.1016/j.microrel.2008.07.029
ISSN
0026-2714
AUTORES DE LA UEX