PUBLICACIÓN

Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level.

ACCEDER A LA PUBLICACIÓN: Dialnet

Jin Su Jeong, S.-D. Park

2009 MICROELECTRONICS RELIABILITY

Atomic and Molecular Physics, and Optics (Q2), Condensed Matter Physics (Q2), Electrical and Electronic Engineering (Q1), Electronic, Optical and Magnetic Materials (Q2), Nanoscience and Nanotechnology (Q3), Safety, Risk, Reliability and Quality (Q1), Surfaces, Coatings and Films (Q2)

JCR: 1.117

SJR: 0.686


DOI

10.1016/j.microrel.2009.07.049

ISSN

0026-2714


AUTORES DE LA UEX