PUBLICACIÓN
Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level.
Jin Su Jeong, S.-D. Park
2009 MICROELECTRONICS RELIABILITY
Atomic and Molecular Physics, and Optics (Q2), Condensed Matter Physics (Q2), Electrical and Electronic Engineering (Q1), Electronic, Optical and Magnetic Materials (Q2), Nanoscience and Nanotechnology (Q3), Safety, Risk, Reliability and Quality (Q1), Surfaces, Coatings and Films (Q2)
JCR: 1.117
SJR: 0.686
DOI
10.1016/j.microrel.2009.07.049
ISSN
0026-2714
AUTORES DE LA UEX